Shanghai district standard & < Calibration Method of Magnification of Transmission Election Microscope> were completed, which will change current situation of lack of traceability and uncertainty evaluation in related national standards. Moreover,it is the first international standard . The other is national standard . The project has also applied three patents. The project achieved advanced international level through the efforts of Institute of Scientific & Technical Information of Shanghai and has be evaluated by a group of experts.

AJ-¢óa atomic force microscope based on the tapping mode of atomic force microscope, matched with grain image manipulation software. It is a device for the surface observing and analyzing of nano grain.

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